000 00220nam a2200085Ia 4500
008 180131b1986 xxu||||| |||| 00| 0 eng d
080 _a
_b
100 _a
245 _aIeee: 0660 - 1986; Semiconductor Memory Test Pattern Language
260 _a
_bIEEE
_c1986
999 _c50108
_d50108