000 | 00316nam a2200085Ia 4500 | ||
---|---|---|---|
008 | 180131b1984 xxu||||| |||| 00| 0 eng d | ||
080 |
_a _b |
||
100 | _aInstitution Of Electrical And Electronics Engineers, Inc. | ||
245 | _aIeee: 1027-1984; Draft Trial Use Standard Method For Measuring The Magnetic Field Intensity Around A | ||
260 |
_a _bIEEE _c1984 |
||
999 |
_c50036 _d50036 |