000 00286nam a2200085Ia 4500
008 180131b1983 xxu||||| |||| 00| 0 eng d
080 _a
_b
100 _aIndian Standards Institution
245 _aIs: 3700(Part X) - 1983; Essential Ratings And Characteristics Of Semiconductor Devices Part X Field
260 _a
_bBIS
_c1983
999 _c49923
_d49923