000			00260nam a2200085Ia 4500
008			180131b1983 xxu||||| |||| 00| 0 eng d
080			_a _b
100			_aIndian Standards Institution
245			_aIs:04400 (Part Iv) - 1981; Methods Of Measurements On Semiconductor Device
260			_a _bBIS _c1983
999			_c49657 _d49657