000 00234nam a2200073 4500
080 _a
_b
245 _aIEEE: C37.20.7 TM-2001; IEEE guide for testing medium-voltage
100 _aInstitute of Electrical and Electronics Engineers, Inc.
260 _aNew Jersey
_bIEEE
_c2001
300 _a16
999 _c37731
_d37731