| 000 | 00353nam a2200073 4500 | ||
|---|---|---|---|
| 080 |
_a _b |
||
| 245 | _aIEEE: 115 - 1995; Guide to Test procedures for synchronous machines part 1 acceptance and performance testing part 2 test procedures and parameter determination for Dynamic Analysis | ||
| 700 | _aInstitute of Electrical and Electronics Engineering Inc | ||
| 260 |
_aNew York _bIEEE _c1995 |
||
| 300 | _a200 | ||
| 999 |
_c35866 _d35866 |
||