000 00251nam a2200073 4500
080 _a
_b
245 _aIEC: 996 - 1989; Method for verifying accuracy of tan delta measurements applicable to capacitors
700 _aInternational Electrotechnical Commission
260 _aGeneva
_bIEC
_c1989
300 _a7p
999 _c35831
_d35831