000 00255nam a2200097 4500
080 _a537.533.35
_bRUS.93
245 _aElectron probe microanalysis and electron scanning microscopy
100 _aRuste, J
700 _aElectricite de France
260 _aParis
_bEDF
_c1993
300 _a79p
999 _c34296
_d34296