000 00215nam a2200073 4500
080 _a
_b
245 _aIEEE: 00167A - 1980; IEEE Facsimile test chart
100 _aInstitute of Electrical and Electronics Engineers Inc.
260 _aNew York
_bIEEE
_c1980
300 _a3
999 _c31380
_d31380