000 00338nam a2200109 4500
080 _a621.3.027.3
_bBOW.73
245 _aMeasurements in high-voltage test circuits
100 _aBowdler, G.W
260 _aOxford
_bPergamon Press
_c1973
300 _aviii+179p
440 _vInternational series of monographs in electrical engineering. Vol. 5
440 _vSilverleaf, D.J
999 _c27121
_d27121