000 00306nam a2200073 4500
080 _a
_b
245 _aIEC: 68 - 1 - 1960; Recommended basic climatic and mechanical robustness testing procedure for components for electronic equipment Part <1=one> General
700 _aInternational Electrotechnical Commission
260 _aGeneva
_bIEC
_c1960
300 _a25p
999 _c24346
_d24346