Semiconductor measurements and instrumentation
Material type:
TextSeries: ; Texas instruments electronics seriesPublication details: Tokyo McGraw-Hill Kogakusha, Ltd. 1975Description: vii+280p
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Text
|
Central Power Research Institute | Central Power Research Institute | 621.315.59 : 621.317 RUN.75 (Browse shelf(Opens below)) | Available | 5997 |
Browsing Central Power Research Institute shelves Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | ||
| 621.315.3 SMI.77 Electrical wiring industrial; code, theory, plans, specifications, installation methods | 621.315.592 HAR.72 Power semiconductor applications Vol. 1 General considerations | 621.315.592 HAR.72 Power semiconductor applications Vol. II Equipment and systems | 621.315.59 : 621.317 RUN.75 Semiconductor measurements and instrumentation | 621.315.6 SMY.55;1 Dielectric behavior and structure; Dielectric constant and loss, Dipole moment and molecular structure | 621.315.61 : 53 TAR.75 Physics of dielectric materials (translated from the Russian) | 621.316(027) SME.77;1 Switchgear and control handbook |
There are no comments on this title.
Log in to your account to post a comment.
